This book cannot be downloaded as a file but can be read in our app or online on the website.
Volume 559 pages
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Surface and Thin Film Analysis. A Compendium of Principles, Instrumentation, and Applications
This book cannot be downloaded as a file but can be read in our app or online on the website.
About the book
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts – electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) «… a useful resource…» (Journal of the American Chemical Society)