Основной контент книги Reliability Wearout Mechanisms in Advanced CMOS Technologies
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Volume 642 pages
Reliability Wearout Mechanisms in Advanced CMOS Technologies
authors
rolf-peter vollertsen,
jordi sune
$226.80
About the book
This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
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Age restriction:
0+Release date on Litres:
26 August 2019Volume:
642 p. ISBN:
9780470455258Total size:
8.2 МБTotal number of pages:
642Copyright holder:
John Wiley & Sons Limited