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Основной контент книги Reliability Wearout Mechanisms in Advanced CMOS Technologies
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Volume 642 pages

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Reliability Wearout Mechanisms in Advanced CMOS Technologies

authors
rolf-peter vollertsen,
jordi sune
Читайте только на Литрес

The book cannot be downloaded as a file, but can be read in our app or online on the website.

$226.80

About the book

This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.

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Book Rolf-Peter Vollertsen, Jordi Sune «Reliability Wearout Mechanisms in Advanced CMOS Technologies» — read online on the website. Leave comments and reviews, vote for your favorites.
Age restriction:
0+
Release date on Litres:
26 August 2019
Volume:
642 p.
ISBN:
9780470455258
Total size:
8.2 МБ
Total number of pages:
642
Copyright holder:
John Wiley & Sons Limited
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