Photoionization and Photo-Induced Processes in Mass Spectrometry

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Fundamentals and Applications
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Book description

Provides comprehensive coverage of laser-induced ionization processes for mass spectrometry analysis <br> <br> Drawing on the expertise of the leading academic and industrial research groups involved in the development of photoionization methods for mass spectrometry, this reference for analytical scientists covers both the theory and current applications of photo-induced ionization processes. It places widely used techniques such as MALDI side by side with more specialist approaches such as REMPI and RIMS, and discusses leading edge developments in ultrashort laser pulse desorption, to give readers a complete picture of the state of the technology. <br> <br> Photoionization and Photo-Induced Processes in Mass Spectrometry: Fundamentals and Applications starts with a complete overview of the fundamentals of the technique, covering the basics of the gas phase ionization as well as those of laser desorption and ablation, pulse photoionization, and single particle ionization. Numerous application examples from different analytical fields are described that showcase the power and the wide scope of photo ionization in mass spectrometry. <br> <br> -The first general reference book on photoionization techniques for mass spectrometry <br> -Examines technologies and applications of gas phase resonance-enhanced multiphoton ionization mass spectrometry (REMPI-MS) and gas phase resonance ionization mass spectrometry (RIMS) <br> -Provides complete coverage of popular techniques like MALDI <br> -Discusses the current and potential applications of each technology, focusing on process and environmental analysis <br> <br> <br> Photoionization and Photo-Induced Processes in Mass Spectrometry: Fundamentals and Applications is an excellent book for spectroscopists, analytical chemists, photochemists, physical chemists, and laser specialists. <br>

Detailed info
Age restriction:
0+
ISBN:
9783527682232
Total size:
0 MB
Total number of pages:
0
Page size:
x мм
Editors:
Luke Hanley, Ralf Zimmermann
Publisher:
Wiley
Copyright:
John Wiley & Sons Limited
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